{"publication":"Nano Letters","issue":"5","publication_status":"published","abstract":[{"lang":"eng","text":"Scanning probe microscopy; Semiconductor quantum dots; Composition gradients; Composition profiles; Nanotomography; Single quantum dots; Strained sige/si; Three-dimensional (3D); Wet-chemical etchings; X-ray scattering measurements; quantum dot; methodology; nanotechnology; optical tomography; scanning probe microscopy; three dimensional imaging; Imaging, Three-Dimensional; Materials Testing; Microscopy, Scanning Probe; Nanotechnology; Quantum Dots; Tomography,"}],"author":[{"full_name":"Rastelli, Armando","first_name":"Armando","last_name":"Rastelli"},{"last_name":"Stoffel","first_name":"Mathieu","full_name":"Stoffel, Mathieu"},{"full_name":"Malachias, Ângelo S","first_name":"Ângelo","last_name":"Malachias"},{"last_name":"Merdzhanova","full_name":"Merdzhanova, Tsvetelina","first_name":"Tsvetelina"},{"first_name":"Georgios","full_name":"Georgios Katsaros","last_name":"Katsaros","id":"38DB5788-F248-11E8-B48F-1D18A9856A87"},{"last_name":"Kern","full_name":"Kern, Klaus","first_name":"Klaus"},{"first_name":"Till","full_name":"Metzger, Till H","last_name":"Metzger"},{"first_name":"Oliver","full_name":"Schmidt, Oliver G","last_name":"Schmidt"}],"doi":"10.1021/nl080290y","_id":"1749","title":"Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography","quality_controlled":0,"intvolume":"         8","volume":8,"publist_id":"5374","date_updated":"2021-01-12T06:52:57Z","type":"journal_article","extern":1,"date_published":"2008-05-01T00:00:00Z","page":"1404 - 1409","status":"public","publisher":"American Chemical Society","year":"2008","day":"01","citation":{"apa":"Rastelli, A., Stoffel, M., Malachias, Â., Merdzhanova, T., Katsaros, G., Kern, K., … Schmidt, O. (2008). Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. <i>Nano Letters</i>. American Chemical Society. <a href=\"https://doi.org/10.1021/nl080290y\">https://doi.org/10.1021/nl080290y</a>","chicago":"Rastelli, Armando, Mathieu Stoffel, Ângelo Malachias, Tsvetelina Merdzhanova, Georgios Katsaros, Klaus Kern, Till Metzger, and Oliver Schmidt. “Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography.” <i>Nano Letters</i>. American Chemical Society, 2008. <a href=\"https://doi.org/10.1021/nl080290y\">https://doi.org/10.1021/nl080290y</a>.","ista":"Rastelli A, Stoffel M, Malachias Â, Merdzhanova T, Katsaros G, Kern K, Metzger T, Schmidt O. 2008. Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. Nano Letters. 8(5), 1404–1409.","ieee":"A. Rastelli <i>et al.</i>, “Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography,” <i>Nano Letters</i>, vol. 8, no. 5. American Chemical Society, pp. 1404–1409, 2008.","short":"A. Rastelli, M. Stoffel, Â. Malachias, T. Merdzhanova, G. Katsaros, K. Kern, T. Metzger, O. Schmidt, Nano Letters 8 (2008) 1404–1409.","mla":"Rastelli, Armando, et al. “Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography.” <i>Nano Letters</i>, vol. 8, no. 5, American Chemical Society, 2008, pp. 1404–09, doi:<a href=\"https://doi.org/10.1021/nl080290y\">10.1021/nl080290y</a>.","ama":"Rastelli A, Stoffel M, Malachias Â, et al. Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. <i>Nano Letters</i>. 2008;8(5):1404-1409. doi:<a href=\"https://doi.org/10.1021/nl080290y\">10.1021/nl080290y</a>"},"date_created":"2018-12-11T11:53:48Z","month":"05","acknowledgement":"This work was supported by the BMBF (No. 03N8711) and the EU project D-DotFET (No. 012150)"}