---
_id: '12109'
abstract:
- lang: eng
  text: Kelvin probe force microscopy (KPFM) is a powerful tool for studying contact
    electrification (CE) at the nanoscale, but converting KPFM voltage maps to charge
    density maps is nontrivial due to long-range forces and complex system geometry.
    Here we present a strategy using finite-element method (FEM) simulations to determine
    the Green's function of the KPFM probe/insulator/ground system, which allows us
    to quantitatively extract surface charge. Testing our approach with synthetic
    data, we find that accounting for the atomic force microscope (AFM) tip, cone,
    and cantilever is necessary to recover a known input and that existing methods
    lead to gross miscalculation or even the incorrect sign of the underlying charge.
    Applying it to experimental data, we demonstrate its capacity to extract realistic
    surface charge densities and fine details from contact-charged surfaces. Our method
    gives a straightforward recipe to convert qualitative KPFM voltage data into quantitative
    charge data over a range of experimental conditions, enabling quantitative CE
    at the nanoscale.
acknowledged_ssus:
- _id: M-Shop
- _id: NanoFab
- _id: ScienComp
acknowledgement: "This project has received funding from the European Research Council
  (ERC) under the European Union’s Horizon 2020 research and innovation programme
  (Grant Agreement\r\nNo. 949120). This research was supported by the Scientific Service
  Units of the Institute of Science and Technology Austria (ISTA) through resources
  provided by the Miba Machine\r\nShop, the Nanofabrication Facility, and the Scientific
  Computing Facility. We thank F. Stumpf from Park Systems for useful discussions
  and support with scanning probe microscopy.\r\nF.P. and J.C.S. contributed equally
  to this work."
article_number: '125605'
article_processing_charge: No
article_type: original
arxiv: 1
author:
- first_name: Felix
  full_name: Pertl, Felix
  id: 6313aec0-15b2-11ec-abd3-ed67d16139af
  last_name: Pertl
- first_name: Juan Carlos A
  full_name: Sobarzo Ponce, Juan Carlos A
  id: 4B807D68-AE37-11E9-AC72-31CAE5697425
  last_name: Sobarzo Ponce
- first_name: Lubuna B
  full_name: Shafeek, Lubuna B
  id: 3CD37A82-F248-11E8-B48F-1D18A9856A87
  last_name: Shafeek
  orcid: 0000-0001-7180-6050
- first_name: Tobias
  full_name: Cramer, Tobias
  last_name: Cramer
- first_name: Scott R
  full_name: Waitukaitis, Scott R
  id: 3A1FFC16-F248-11E8-B48F-1D18A9856A87
  last_name: Waitukaitis
  orcid: 0000-0002-2299-3176
citation:
  ama: Pertl F, Sobarzo Ponce JCA, Shafeek LB, Cramer T, Waitukaitis SR. Quantifying
    nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid
    approach. <i>Physical Review Materials</i>. 2022;6(12). doi:<a href="https://doi.org/10.1103/PhysRevMaterials.6.125605">10.1103/PhysRevMaterials.6.125605</a>
  apa: Pertl, F., Sobarzo Ponce, J. C. A., Shafeek, L. B., Cramer, T., &#38; Waitukaitis,
    S. R. (2022). Quantifying nanoscale charge density features of contact-charged
    surfaces with an FEM/KPFM-hybrid approach. <i>Physical Review Materials</i>. American
    Physical Society. <a href="https://doi.org/10.1103/PhysRevMaterials.6.125605">https://doi.org/10.1103/PhysRevMaterials.6.125605</a>
  chicago: Pertl, Felix, Juan Carlos A Sobarzo Ponce, Lubuna B Shafeek, Tobias Cramer,
    and Scott R Waitukaitis. “Quantifying Nanoscale Charge Density Features of Contact-Charged
    Surfaces with an FEM/KPFM-Hybrid Approach.” <i>Physical Review Materials</i>.
    American Physical Society, 2022. <a href="https://doi.org/10.1103/PhysRevMaterials.6.125605">https://doi.org/10.1103/PhysRevMaterials.6.125605</a>.
  ieee: F. Pertl, J. C. A. Sobarzo Ponce, L. B. Shafeek, T. Cramer, and S. R. Waitukaitis,
    “Quantifying nanoscale charge density features of contact-charged surfaces with
    an FEM/KPFM-hybrid approach,” <i>Physical Review Materials</i>, vol. 6, no. 12.
    American Physical Society, 2022.
  ista: Pertl F, Sobarzo Ponce JCA, Shafeek LB, Cramer T, Waitukaitis SR. 2022. Quantifying
    nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid
    approach. Physical Review Materials. 6(12), 125605.
  mla: Pertl, Felix, et al. “Quantifying Nanoscale Charge Density Features of Contact-Charged
    Surfaces with an FEM/KPFM-Hybrid Approach.” <i>Physical Review Materials</i>,
    vol. 6, no. 12, 125605, American Physical Society, 2022, doi:<a href="https://doi.org/10.1103/PhysRevMaterials.6.125605">10.1103/PhysRevMaterials.6.125605</a>.
  short: F. Pertl, J.C.A. Sobarzo Ponce, L.B. Shafeek, T. Cramer, S.R. Waitukaitis,
    Physical Review Materials 6 (2022).
date_created: 2023-01-08T23:00:53Z
date_published: 2022-12-29T00:00:00Z
date_updated: 2023-08-03T14:11:29Z
day: '29'
department:
- _id: ScWa
- _id: NanoFab
doi: 10.1103/PhysRevMaterials.6.125605
ec_funded: 1
external_id:
  arxiv:
  - '2209.01889'
  isi:
  - '000908384800001'
intvolume: '         6'
isi: 1
issue: '12'
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: ' https://doi.org/10.48550/arXiv.2209.01889'
month: '12'
oa: 1
oa_version: Preprint
project:
- _id: 0aa60e99-070f-11eb-9043-a6de6bdc3afa
  call_identifier: H2020
  grant_number: '949120'
  name: 'Tribocharge: a multi-scale approach to an enduring problem in physics'
publication: Physical Review Materials
publication_identifier:
  eissn:
  - 2475-9953
publication_status: published
publisher: American Physical Society
quality_controlled: '1'
scopus_import: '1'
status: public
title: Quantifying nanoscale charge density features of contact-charged surfaces with
  an FEM/KPFM-hybrid approach
type: journal_article
user_id: 4359f0d1-fa6c-11eb-b949-802e58b17ae8
volume: 6
year: '2022'
...