---
_id: '7055'
abstract:
- lang: eng
  text: A recent class of topological nodal-line semimetals with the general formula
    MSiX (M = Zr, Hf and X = S, Se, Te) has attracted much experimental and theoretical
    interest due to their properties, particularly their large magnetoresistances
    and high carrier mobilities. The plateletlike nature of the MSiX crystals and
    their extremely low residual resistivities make measurements of the resistivity
    along the [001] direction extremely challenging. To accomplish such measurements,
    microstructures of single crystals were prepared using focused ion beam techniques.
    Microstructures prepared in this manner have very well-defined geometries and
    maintain their high crystal quality, verified by the observations of quantum oscillations.
    We present magnetoresistance and quantum oscillation data for currents applied
    along both [001] and [100] in ZrSiS and ZrSiSe, which are consistent with the
    nontrivial topology of the Dirac line-node, as determined by a measured π Berry
    phase. Surprisingly, we find that, despite the three dimensional nature of both
    the Fermi surfaces of ZrSiS and ZrSiSe, both the resistivity anisotropy under
    applied magnetic fields and the in-plane angular dependent magnetoresistance differ
    considerably between the two compounds. Finally, we discuss the role microstructuring
    can play in the study of these materials and our ability to make these microstructures
    free-standing.
article_number: '101116'
article_processing_charge: No
article_type: original
author:
- first_name: Kent R.
  full_name: Shirer, Kent R.
  last_name: Shirer
- first_name: Kimberly A
  full_name: Modic, Kimberly A
  id: 13C26AC0-EB69-11E9-87C6-5F3BE6697425
  last_name: Modic
  orcid: 0000-0001-9760-3147
- first_name: Tino
  full_name: Zimmerling, Tino
  last_name: Zimmerling
- first_name: Maja D.
  full_name: Bachmann, Maja D.
  last_name: Bachmann
- first_name: Markus
  full_name: König, Markus
  last_name: König
- first_name: Philip J. W.
  full_name: Moll, Philip J. W.
  last_name: Moll
- first_name: Leslie
  full_name: Schoop, Leslie
  last_name: Schoop
- first_name: Andrew P.
  full_name: Mackenzie, Andrew P.
  last_name: Mackenzie
citation:
  ama: Shirer KR, Modic KA, Zimmerling T, et al. Out-of-plane transport in ZrSiS and
    ZrSiSe microstructures. <i>APL Materials</i>. 2019;7(10). doi:<a href="https://doi.org/10.1063/1.5124568">10.1063/1.5124568</a>
  apa: Shirer, K. R., Modic, K. A., Zimmerling, T., Bachmann, M. D., König, M., Moll,
    P. J. W., … Mackenzie, A. P. (2019). Out-of-plane transport in ZrSiS and ZrSiSe
    microstructures. <i>APL Materials</i>. AIP. <a href="https://doi.org/10.1063/1.5124568">https://doi.org/10.1063/1.5124568</a>
  chicago: Shirer, Kent R., Kimberly A Modic, Tino Zimmerling, Maja D. Bachmann, Markus
    König, Philip J. W. Moll, Leslie Schoop, and Andrew P. Mackenzie. “Out-of-Plane
    Transport in ZrSiS and ZrSiSe Microstructures.” <i>APL Materials</i>. AIP, 2019.
    <a href="https://doi.org/10.1063/1.5124568">https://doi.org/10.1063/1.5124568</a>.
  ieee: K. R. Shirer <i>et al.</i>, “Out-of-plane transport in ZrSiS and ZrSiSe microstructures,”
    <i>APL Materials</i>, vol. 7, no. 10. AIP, 2019.
  ista: Shirer KR, Modic KA, Zimmerling T, Bachmann MD, König M, Moll PJW, Schoop
    L, Mackenzie AP. 2019. Out-of-plane transport in ZrSiS and ZrSiSe microstructures.
    APL Materials. 7(10), 101116.
  mla: Shirer, Kent R., et al. “Out-of-Plane Transport in ZrSiS and ZrSiSe Microstructures.”
    <i>APL Materials</i>, vol. 7, no. 10, 101116, AIP, 2019, doi:<a href="https://doi.org/10.1063/1.5124568">10.1063/1.5124568</a>.
  short: K.R. Shirer, K.A. Modic, T. Zimmerling, M.D. Bachmann, M. König, P.J.W. Moll,
    L. Schoop, A.P. Mackenzie, APL Materials 7 (2019).
date_created: 2019-11-19T12:52:43Z
date_published: 2019-10-17T00:00:00Z
date_updated: 2021-01-12T08:11:35Z
day: '17'
ddc:
- '530'
doi: 10.1063/1.5124568
extern: '1'
file:
- access_level: open_access
  checksum: 142fe7b3e37d8e916071743bb194360d
  content_type: application/pdf
  creator: dernst
  date_created: 2019-11-20T12:27:01Z
  date_updated: 2020-07-14T12:47:48Z
  file_id: '7087'
  file_name: 2019_APL_Shirer.pdf
  file_size: 2453220
  relation: main_file
file_date_updated: 2020-07-14T12:47:48Z
has_accepted_license: '1'
intvolume: '         7'
issue: '10'
language:
- iso: eng
month: '10'
oa: 1
oa_version: Published Version
publication: APL Materials
publication_identifier:
  issn:
  - 2166-532X
publication_status: published
publisher: AIP
quality_controlled: '1'
status: public
title: Out-of-plane transport in ZrSiS and ZrSiSe microstructures
tmp:
  image: /images/cc_by.png
  legal_code_url: https://creativecommons.org/licenses/by/4.0/legalcode
  name: Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)
  short: CC BY (4.0)
type: journal_article
user_id: 2DF688A6-F248-11E8-B48F-1D18A9856A87
volume: 7
year: '2019'
...