[{"issue":"2","article_processing_charge":"No","page":"395-400","_id":"7455","abstract":[{"text":"The reaction between NiO and (0001)- and ([1\\bar102])-oriented Al2O3 single crystals has been investigated on model experimental systems by using the ReflEXAFS technique. Depth-sensitive information is obtained by collecting data above and below the critical angle for total reflection. A systematic protocol for data analysis, based on the recently developed CARD code, was implemented, and a detailed description of the reactive systems was obtained. In particular, for ([1\\bar102])-oriented Al2O3, the reaction with NiO is almost complete after heating for 6 h at 1273 K, and an almost uniform layer of spinel is found below a mixed (NiO + spinel) layer at the very upmost part of the sample. In the case of the (0001)-oriented Al2O3, for the same temperature and heating time, the reaction shows a lower advancement degree and a residual fraction of at least 30% NiO is detected in the ReflEXAFS spectra. ","lang":"eng"}],"date_published":"2014-01-10T00:00:00Z","date_created":"2020-02-05T14:14:48Z","extern":"1","month":"01","publication_status":"published","publisher":"International Union of Crystallography","volume":21,"status":"public","intvolume":"        21","quality_controlled":"1","publication":"Journal of Synchrotron Radiation","title":"Studying the surface reaction between NiO and Al2O3viatotal reflection EXAFS (ReflEXAFS)","citation":{"mla":"Costanzo, Tommaso, et al. “Studying the Surface Reaction between NiO and Al2O3viatotal Reflection EXAFS (ReflEXAFS).” <i>Journal of Synchrotron Radiation</i>, vol. 21, no. 2, International Union of Crystallography, 2014, pp. 395–400, doi:<a href=\"https://doi.org/10.1107/s1600577513031299\">10.1107/s1600577513031299</a>.","chicago":"Costanzo, Tommaso, Federico Benzi, Paolo Ghigna, Sonia Pin, Giorgio Spinolo, and Francesco d’Acapito. “Studying the Surface Reaction between NiO and Al2O3viatotal Reflection EXAFS (ReflEXAFS).” <i>Journal of Synchrotron Radiation</i>. International Union of Crystallography, 2014. <a href=\"https://doi.org/10.1107/s1600577513031299\">https://doi.org/10.1107/s1600577513031299</a>.","ieee":"T. Costanzo, F. Benzi, P. Ghigna, S. Pin, G. Spinolo, and F. d’Acapito, “Studying the surface reaction between NiO and Al2O3viatotal reflection EXAFS (ReflEXAFS),” <i>Journal of Synchrotron Radiation</i>, vol. 21, no. 2. International Union of Crystallography, pp. 395–400, 2014.","ista":"Costanzo T, Benzi F, Ghigna P, Pin S, Spinolo G, d’Acapito F. 2014. Studying the surface reaction between NiO and Al2O3viatotal reflection EXAFS (ReflEXAFS). Journal of Synchrotron Radiation. 21(2), 395–400.","ama":"Costanzo T, Benzi F, Ghigna P, Pin S, Spinolo G, d’Acapito F. Studying the surface reaction between NiO and Al2O3viatotal reflection EXAFS (ReflEXAFS). <i>Journal of Synchrotron Radiation</i>. 2014;21(2):395-400. doi:<a href=\"https://doi.org/10.1107/s1600577513031299\">10.1107/s1600577513031299</a>","apa":"Costanzo, T., Benzi, F., Ghigna, P., Pin, S., Spinolo, G., &#38; d’Acapito, F. (2014). Studying the surface reaction between NiO and Al2O3viatotal reflection EXAFS (ReflEXAFS). <i>Journal of Synchrotron Radiation</i>. International Union of Crystallography. <a href=\"https://doi.org/10.1107/s1600577513031299\">https://doi.org/10.1107/s1600577513031299</a>","short":"T. Costanzo, F. Benzi, P. Ghigna, S. Pin, G. Spinolo, F. d’Acapito, Journal of Synchrotron Radiation 21 (2014) 395–400."},"oa_version":"None","year":"2014","author":[{"full_name":"Costanzo, Tommaso","first_name":"Tommaso","last_name":"Costanzo","orcid":"0000-0001-9732-3815","id":"D93824F4-D9BA-11E9-BB12-F207E6697425"},{"last_name":"Benzi","first_name":"Federico","full_name":"Benzi, Federico"},{"last_name":"Ghigna","first_name":"Paolo","full_name":"Ghigna, Paolo"},{"first_name":"Sonia","full_name":"Pin, Sonia","last_name":"Pin"},{"full_name":"Spinolo, Giorgio","first_name":"Giorgio","last_name":"Spinolo"},{"first_name":"Francesco","full_name":"d'Acapito, Francesco","last_name":"d'Acapito"}],"type":"journal_article","day":"10","article_type":"original","doi":"10.1107/s1600577513031299","publication_identifier":{"issn":["1600-5775"]},"date_updated":"2023-02-23T13:08:22Z","language":[{"iso":"eng"}],"user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87"}]