@article{7455,
  abstract     = {The reaction between NiO and (0001)- and ([1\bar102])-oriented Al2O3 single crystals has been investigated on model experimental systems by using the ReflEXAFS technique. Depth-sensitive information is obtained by collecting data above and below the critical angle for total reflection. A systematic protocol for data analysis, based on the recently developed CARD code, was implemented, and a detailed description of the reactive systems was obtained. In particular, for ([1\bar102])-oriented Al2O3, the reaction with NiO is almost complete after heating for 6 h at 1273 K, and an almost uniform layer of spinel is found below a mixed (NiO + spinel) layer at the very upmost part of the sample. In the case of the (0001)-oriented Al2O3, for the same temperature and heating time, the reaction shows a lower advancement degree and a residual fraction of at least 30% NiO is detected in the ReflEXAFS spectra. },
  author       = {Costanzo, Tommaso and Benzi, Federico and Ghigna, Paolo and Pin, Sonia and Spinolo, Giorgio and d'Acapito, Francesco},
  issn         = {1600-5775},
  journal      = {Journal of Synchrotron Radiation},
  number       = {2},
  pages        = {395--400},
  publisher    = {International Union of Crystallography},
  title        = {{Studying the surface reaction between NiO and Al2O3viatotal reflection EXAFS (ReflEXAFS)}},
  doi          = {10.1107/s1600577513031299},
  volume       = {21},
  year         = {2014},
}