Bias in pruned vision models: In-depth analysis and countermeasures
E.B. Iofinova, E.-A. Peste, D.-A. Alistarh, in:, 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2023, pp. 24364–24373.

How well do sparse ImageNet models transfer?
E.B. Iofinova, E.-A. Peste, M. Kurtz, D.-A. Alistarh, in:, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, Institute of Electrical and Electronics Engineers, 2022, pp. 12256–12266.

Leveling down in computer vision: Pareto inefficiencies in fair deep classifiers
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Leveraging 2D data to learn textured 3D mesh generation
P.M. Henderson, V. Tsiminaki, C. Lampert, in:, Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2020, pp. 7498–7507.

Learning intelligent dialogs for bounding box annotation
J. Uijlings, K. Konyushkova, C. Lampert, V. Ferrari, in:, 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2018, pp. 9175–9184.