Bias in pruned vision models: In-depth analysis and countermeasures
E.B. Iofinova, E.-A. Peste, D.-A. Alistarh, in:, 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2023, pp. 24364–24373.

Leveling down in computer vision: Pareto inefficiencies in fair deep classifiers
D. Zietlow, M. Lohaus, G. Balakrishnan, M. Kleindessner, F. Locatello, B. Scholkopf, C. Russell, in:, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, Institute of Electrical and Electronics Engineers, 2022, pp. 10400–10411.

How well do sparse ImageNet models transfer?
E.B. Iofinova, E.-A. Peste, M. Kurtz, D.-A. Alistarh, in:, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, Institute of Electrical and Electronics Engineers, 2022, pp. 12256–12266.

Leveraging 2D data to learn textured 3D mesh generation
P.M. Henderson, V. Tsiminaki, C. Lampert, in:, Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2020, pp. 7498–7507.

Learning intelligent dialogs for bounding box annotation
J. Uijlings, K. Konyushkova, C. Lampert, V. Ferrari, in:, 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2018, pp. 9175–9184.